Ferri, C., Faraway, J. and Brousseau, Emmanuel Bruno Jean Paul ORCID: https://orcid.org/0000-0003-2728-3189 2010. Calibration of a white light interferometer for the measurement of micro-scale dimensions. International Journal of Advanced Manufacturing Technology 47 (1-4) , pp. 125-135. 10.1007/s00170-009-2050-7 |
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Engineering Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC) |
Publisher: | Springer Verlag |
ISSN: | 0268-3768 |
Funders: | EPSRC |
Last Modified: | 17 Oct 2022 10:20 |
URI: | https://orca.cardiff.ac.uk/id/eprint/7735 |
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