Modulated waveform measurement and engineering system

Chaudhary, Muhammad Akmal, Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2016. Modulated waveform measurement and engineering system. Presented at: 2015 2nd International Conference on Electronics and Communication Systems (ICECS), Cairo, Egypt, 6-9 December 2015. 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2015). Institute of Electrical and Electronics Engineers (IEEE), pp. 252-255. 10.1109/ICECS.2015.7440296

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Abstract

This paper presents an enhanced time-domain modulated waveform measurement and engineering system. The measurement system is based around a standard sampling oscilloscope and consists of a test set which integrates both RF and IF measurement and engineering, merging the capabilities of DC, CW, and multi-tone measurement system. The aim of the system is to extend the design role of waveform measurement and engineering into the multi-tone domain allowing optimization of power amplifiers under more realistic operating conditions akin to those found in modern day wireless systems. A GaN transistor has been measured, and results are presented that highlight the capabilities and applications of the system.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Publisher:	Institute of Electrical and Electronics Engineers (IEEE)
ISBN:	978-1-5090-0246-7
Last Modified:	21 Oct 2022 06:50
URI:	https://orca.cardiff.ac.uk/id/eprint/98543

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