Chaudhary, Muhammad Akmal, Lees, Jonathan  ORCID: https://orcid.org/0000-0002-6217-7552, Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830
2016.
Modulated waveform measurement and engineering system.
Presented at: 2015 2nd International Conference on Electronics and Communication Systems (ICECS),
Cairo, Egypt,
6-9 December 2015.
2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2015).
Institute of Electrical and Electronics Engineers (IEEE),
pp. 252-255.
10.1109/ICECS.2015.7440296
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Abstract
This paper presents an enhanced time-domain modulated waveform measurement and engineering system. The measurement system is based around a standard sampling oscilloscope and consists of a test set which integrates both RF and IF measurement and engineering, merging the capabilities of DC, CW, and multi-tone measurement system. The aim of the system is to extend the design role of waveform measurement and engineering into the multi-tone domain allowing optimization of power amplifiers under more realistic operating conditions akin to those found in modern day wireless systems. A GaN transistor has been measured, and results are presented that highlight the capabilities and applications of the system.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Date Type: | Publication |
| Status: | Published |
| Schools: | Schools > Engineering |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
| ISBN: | 978-1-5090-0246-7 |
| Last Modified: | 21 Oct 2022 06:50 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/98543 |
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