Cardiff University | Prifysgol Caerdydd ORCA
Online Research @ Cardiff 
WelshClear Cookie - decide language by browser settings

Modulated waveform measurement and engineering system

Chaudhary, Muhammad Akmal, Lees, Jonathan, Benedikt, Johannes and Tasker, Paul J. 2016. Modulated waveform measurement and engineering system. Presented at: 2015 2nd International Conference on Electronics and Communication Systems (ICECS), Cairo, Egypt, 6-9 December 2015. 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2015). Institute of Electrical and Electronics Engineers (IEEE), pp. 252-255. 10.1109/ICECS.2015.7440296

Full text not available from this repository.


This paper presents an enhanced time-domain modulated waveform measurement and engineering system. The measurement system is based around a standard sampling oscilloscope and consists of a test set which integrates both RF and IF measurement and engineering, merging the capabilities of DC, CW, and multi-tone measurement system. The aim of the system is to extend the design role of waveform measurement and engineering into the multi-tone domain allowing optimization of power amplifiers under more realistic operating conditions akin to those found in modern day wireless systems. A GaN transistor has been measured, and results are presented that highlight the capabilities and applications of the system.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
ISBN: 978-1-5090-0246-7
Last Modified: 24 May 2020 15:15

Citation Data

Cited 1 time in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item Edit Item