Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

Hubmayr, J., Beall, J., Becker, D., Cho, H.-M., Devlin, M., Dober, B., Groppi, C., Hilton, G. C., Irwin, K. D., Li, D., Mauskopf, Philip Daniel ORCID: https://orcid.org/0000-0001-6397-5516, Pappas, D. P., Van Lanen, J., Vissers, M. R., Wang, Y., Wei, L. F. and Gao, J. 2015. Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors. Applied Physics Letters 106 (7) , 073505. 10.1063/1.4913418

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Abstract

We demonstrate photon-noise limited performance at sub-millimeter wavelengths in feedhorncoupled, microwave kinetic inductance detectors made of a TiN/Ti/TiN trilayer superconducting film, tuned to have a transition temperature of 1.4 K. Micro-machining of the silicon-on-insulator wafer backside creates a quarter-wavelength backshort optimized for efficient coupling at 250 lm. Using frequency read out and when viewing a variable temperature blackbody source, we measure device noise consistent with photon noise when the incident optical power is >0.5 pW, corresponding to noise equivalent powers >3×10−17 W/Hz⎯⎯⎯⎯⎯√>3×10−17 W/Hz. This sensitivity makes these devices suitable for broadband photometric applications at these wavelengths.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	American Institute of Physics
ISSN:	0003-6951
Date of First Compliant Deposit:	14 July 2017
Date of Acceptance:	24 January 2015
Last Modified:	03 May 2023 01:02
URI:	https://orca.cardiff.ac.uk/id/eprint/102443

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