Cardiff University | Prifysgol Caerdydd ORCA
Online Research @ Cardiff 
WelshClear Cookie - decide language by browser settings

Interference lithography processes with high-power laser pulses

Meunier, Michel, Rodriguez, A., Holmes, Andrew S., Ellman, M., Ayerdi, I., Niino, Hiroyuki, Gu, Bo, Perez, N., Olaizola, S. M., Zhang, J., Ji, Z. ORCID:, Berthou, T., Peng, C. S., Verevkin, Y. K. and Wang, Z. 2009. Interference lithography processes with high-power laser pulses. Presented at: SPIE LASE: Lasers and Applications in Science and Engineering, San Jose, California, 2009. Published in: Meunier, Michel, Holmes, Andrew S., Niino, Hiroyuki and Gu, Bo eds. Laser Applications in Microelectronic and Optoelectronic Manufacturing VII. Proceedings- Spie the International Society for Optical Engineering. , vol.7201 International Society for Optical Engineering; 1999, 72010R. 10.1117/12.808834

Full text not available from this repository.


Laser interference lithography (LIL) is concerned with the use of interference patterns generated from two or several coherent beams of laser radiation for the structuring of materials. This paper presents the work on the processes based on resists and direct writing with laser interference lithography. In the work, a four-beam laser interference system was used as a submicrometer structuring tool in which a high-energy pulsed, frequency-tripled and TM polarized Nd:YAG laser (355 nm) with a coherent length of 3 m, energy power up to 320 mJ/cm2, pulse duration of 8 ns and 10 Hz repetition rate was used as a light source. The experimental results were achieved with 2-beam and 4-beam interference patterning. The processes can be used to define submicron surface relieves in large areas for use in the field of MEMS.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Publisher: International Society for Optical Engineering; 1999
ISSN: 0277-786X
Last Modified: 23 Oct 2022 13:14

Citation Data

Cited 2 times in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item Edit Item