Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization

Wildanger, Dominik, Patton, Brian R., Schill, Heiko, Marseglia, Luca, Hadden, J. P. ORCID: https://orcid.org/0000-0001-5407-6754, Knauer, Sebastian, Schönle, Andreas, Rarity, John G., O'Brien, Jeremy L., Hell, Stefan W. and Smith, Jason M. 2012. Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization. Advanced Materials 24 (44) , OP309-OP313. 10.1002/adma.201203033

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Abstract

Exploring the maximum spatial resolution achievable in far‐field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Schools > Physics and Astronomy
Publisher:	Wiley-VCH Verlag
ISSN:	0935-9648
Last Modified:	24 Oct 2022 07:06
URI:	https://orca.cardiff.ac.uk/id/eprint/114119

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