Jennings, Brian D., Abadia, Nicolas ![]() |
Official URL: http://dx.doi.org/10.1364/CLEO_SI.2016.SM1F.6
Abstract
Propagation of light through planar waveguides is important for photonic integrated circuits. Experimentally imaging light intensity within multimode waveguides shows how different modes interfere. These images can be used to determine waveguide properties.
Item Type: | Conference or Workshop Item (Paper) |
---|---|
Date Type: | Publication |
Status: | Published |
Schools: | Physics and Astronomy |
Publisher: | Optical Society of America |
ISBN: | 978-1-943580-11-8 |
Last Modified: | 24 Oct 2022 08:15 |
URI: | https://orca.cardiff.ac.uk/id/eprint/117269 |
Actions (repository staff only)
![]() |
Edit Item |