Nonlinear dependence of X-ray diffraction peak broadening in In x Ga1− x Sb epitaxial layers on GaAs substrates

Huynh, Sa Hoang, Ha, Minh Thien Huu, Binh Do, Huy, Nguyen, Tuan Anh, Luc, Quang Ho and Chang, Edward Yi 2018. Nonlinear dependence of X-ray diffraction peak broadening in In x Ga1− x Sb epitaxial layers on GaAs substrates. Applied Physics Express 11 (4) , 045503. 10.7567/APEX.11.045503

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Item Type:	Article
Date Type:	Published Online
Status:	Published
Schools:	Physics and Astronomy
Publisher:	IOP Publishing
ISSN:	1882-0778
Date of Acceptance:	12 March 2018
Last Modified:	28 Jul 2020 01:23
URI:	https://orca.cardiff.ac.uk/id/eprint/121860

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