Thayne, I. G., Edgar, D. L., Elgaid, K. ORCID: https://orcid.org/0000-0003-3265-1097, Chong, H., Jubber, M., McLelland, H., Ferguson, S., Ross, A., Arnold, J. M., Heeres, R., Whybourn, N., Luinge, W., Van Der Vorst, M., Neto, A. and De Maagt, P. 2002. On-wafer W-band determination of the driving point impedance of a double slot antenna. Presented at: Colloquium on Microwave Measurements: Current Techniques and Trends, London, England, UK, 23 February 1999. IEE Colloquium on Microwave Measurements: Current Techniques and Trends (Ref. No. 1999/008). , vol.1999 IET, pp. 3-4. 10.1049/ic:19990026 |
Official URL: http://dx.doi.org/10.1049/ic:19990026
Abstract
Part of the ESTEC funded Integrated Antenna Development project includes the development of an optimised 500 GHz planar antenna on a dielectric lens. One aspect of this study involves the development of an accurate model for the antenna impedance at the point where a bolometric detector is inserted in the receiver. To verify the modelling, an on-wafer measurement strategy to determine the driving point impedance of a 100 GHz scale model of the antenna structure was developed. This paper describes the W-band on-wafer measurement technique and compares the experimentally and theoretically derived feed point impedances of the antenna structures.
Item Type: | Conference or Workshop Item (Paper) |
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Date Type: | Published Online |
Status: | Published |
Schools: | Engineering |
Publisher: | IET |
Last Modified: | 04 Nov 2022 12:18 |
URI: | https://orca.cardiff.ac.uk/id/eprint/122577 |
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