A systematic investigation of admittance domain behavioral model complexity requirements

Moure, M. Rocio, Casbon, Michael ORCID: https://orcid.org/0000-0002-8637-9888, Ladero, Nicolas, Fernandez-Barciela, Monica and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2018. A systematic investigation of admittance domain behavioral model complexity requirements. Presented at: 2018 IEEE MTT-S Latin America Microwave Conference (LAMC 2018), Arequipa, Peru, 12-14 December 2018. 2018 IEEE MTT-S Latin America Microwave Conference (LAMC 2018). Piscataway, NJ: IEEE, 10.1109/LAMC.2018.8699054

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Abstract

Non-linear frequency-domain I-V behavioral models have recently been proposed as an alternative to A-B behavioral models. Admittance formulation is suitable for model scaling with device size and fundamental frequency, very convenient for MMICs CAD. But direct extraction from NVNA measurements, easy to perform with A-B models, is difficult, since we need to account for input variations. Hence determining the required model complexity to aid in the extraction/modelling process becomes a key issue. In this paper, a systematic investigation of the Admittance model complexity requirements to obtain sufficiently accurate model predictions suitable for microwave power amplifier design requirements, is performed.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering
Publisher:	IEEE
ISBN:	978-1-5386-7333-1
Last Modified:	04 Nov 2022 12:26
URI:	https://orca.cardiff.ac.uk/id/eprint/123067

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