Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials

Isaacs, Mark A., Davies-Jones, Josh, Davies, Philip R. ORCID: https://orcid.org/0000-0003-4394-766X, Guan, Shaoliang, Lee, Roxy, Morgan, David J. ORCID: https://orcid.org/0000-0002-6571-5731, Palgrave, Robert and 2021. Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials. Materials Chemistry Frontiers 5 (22) , pp. 7931-7963. 10.1039/D1QM00969A

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Abstract

X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in that it is a ubiquitous tool in the materials community, however as made apparent by recent reviews highlighting it's misuse as a means of chemical deduction, it is a practice which is greatly misunderstood even in its simplest form. Advanced XPS techniques, or a combination of XPS and a complementary surficial probe may elicit auxiliary information outside of the scope of the standard sphere of appreciation. This review aims to bring to the attention of the general materials audience a landscape of some atypical applications of lab-based XPS and combinatorial approaches of related surface analysis, such as ion scattering, ultraviolet photoelectron, electron energy loss and auger emission spectroscopies found on many lab-based instrument set-ups.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Chemistry Cardiff Catalysis Institute (CCI)
Additional Information:	This article is licensed under a Creative Commons Attribution 3.0 Unported Licence.
Publisher:	Royal Society of Chemistry
ISSN:	2052-1537
Funders:	EPSRC
Date of First Compliant Deposit:	18 October 2021
Date of Acceptance:	22 September 2021
Last Modified:	05 May 2023 16:13
URI:	https://orca.cardiff.ac.uk/id/eprint/144904

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