Isaacs, Mark A., Davies-Jones, Josh, Davies, Philip R.  ORCID: https://orcid.org/0000-0003-4394-766X, Guan, Shaoliang, Lee, Roxy, Morgan, David J. ORCID: https://orcid.org/0000-0002-6571-5731, Palgrave, Robert and
2021.
Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials.
Materials Chemistry Frontiers
5
(22)
, pp. 7931-7963.
10.1039/D1QM00969A
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Abstract
X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in that it is a ubiquitous tool in the materials community, however as made apparent by recent reviews highlighting it's misuse as a means of chemical deduction, it is a practice which is greatly misunderstood even in its simplest form. Advanced XPS techniques, or a combination of XPS and a complementary surficial probe may elicit auxiliary information outside of the scope of the standard sphere of appreciation. This review aims to bring to the attention of the general materials audience a landscape of some atypical applications of lab-based XPS and combinatorial approaches of related surface analysis, such as ion scattering, ultraviolet photoelectron, electron energy loss and auger emission spectroscopies found on many lab-based instrument set-ups.
| Item Type: | Article |
|---|---|
| Date Type: | Publication |
| Status: | Published |
| Schools: | Schools > Chemistry Research Institutes & Centres > Cardiff Catalysis Institute (CCI) |
| Additional Information: | This article is licensed under a Creative Commons Attribution 3.0 Unported Licence. |
| Publisher: | Royal Society of Chemistry |
| ISSN: | 2052-1537 |
| Funders: | EPSRC |
| Date of First Compliant Deposit: | 18 October 2021 |
| Date of Acceptance: | 22 September 2021 |
| Last Modified: | 05 May 2023 16:13 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/144904 |
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