Barton, C. W., Slater, T. J. A. ![]() |
Abstract
We demonstrate the control of perpendicular magnetic anisotropy (PMA) in multilayer films without modification of either the microstructure or saturation magnetization by tuning the Ar+ ion energy using remote plasma sputtering. We show that for [Co/Pd]8 multilayer films, increasing the Ar+ ion energy results in a strong decrease in PMA through an increase in interfacial roughness determined by X-ray reflectivity measurements. X-ray diffraction and transmission electron microscope image data show that the microstructure is independent of Ar+ energy. This opens a different approach to the in-situ deposition of graded exchange springs and for control of the polarizing layer in hybrid spin transfer torque devices. ACKNOWLEDGMENTS
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Chemistry |
Publisher: | American Institute of Physics |
ISSN: | 0021-8979 |
Last Modified: | 14 Dec 2022 02:11 |
URI: | https://orca.cardiff.ac.uk/id/eprint/147165 |
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