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Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

Yankovich, A.B., Zhang, C., Oh, A., Slater, T.J.A., Azough, F., Freer, R., Haigh, S.J., Willett, R. and Voyles, P.M. 2016. Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. Nanotechnology 27 (36) , 364001. 10.1088/0957-4484/27/36/364001

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Abstract

Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Chemistry
Publisher: IOP Publishing
ISSN: 0957-4484
Last Modified: 24 Feb 2022 12:01
URI: https://orca.cardiff.ac.uk/id/eprint/147217

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