Effects of thermal annealing upon the nanomorphology of poly(3-hexylselenophene)-PCBM blends

Lilliu, Samuele, Agostinelli, Tiziano, Verploegen, Eric, Pires, Ellis, Hampton, Mark David, Al-Hashimi, Mohammed, Heeney, Martin J., Toney, Michael F., Nelson, Jenny and Macdonald, John Emyr ORCID: https://orcid.org/0000-0001-5504-1692 2011. Effects of thermal annealing upon the nanomorphology of poly(3-hexylselenophene)-PCBM blends. Macromolecular Rapid Communications 32 (18) , pp. 1454-1460. 10.1002/marc.201100330

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Abstract

Grazing incidence X-ray diffraction (GI-XRD) is used to characterize the crystallographic dynamics of low molecular weight (LMW) and high molecular weight (HMW) poly(3-hexylselenophene) (P3HS) films and blend films of P3HS with [6-6-]-phenyl-C61-butyric acid methyl ester (PCBM) as a function of ‘step-by-step’ thermal annealing, from room temperature to 250 °C. The temperature-dependent GIXRD data show how the melting point of P3HS crystallites is decreased by the presence of PCBM. P3HS crystallite domain sizes dramatically increase upon annealing to the P3HS melting temperature. The formation of well-oriented HMW P3HS crystallites with the (100) plane parallel to the substrate (edge-on orientation), when cooled from melt, are observed. We compare the behaviour of P3HS pure and blend films with that of poly(3-hexyl)thiophene (P3HT) pure and PCBM blended films and suggest that the similar temperature dependent behaviour we observe may be a common to polythiophene and related polymers and their blends.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Uncontrolled Keywords:	conjugated polymers ; crystallization ; disorder ; fullerenes ; wide-angle X-ray scattering
Publisher:	Wiley
ISSN:	1022-1336
Funders:	EPSRC
Last Modified:	18 Oct 2022 13:47
URI:	https://orca.cardiff.ac.uk/id/eprint/15385

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