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Few-shot classification for image-based crack detection

Gao, Yan ORCID:, Li, Haijiang ORCID:, Fu, Weiqi and Xiong, Guanyu 2023. Few-shot classification for image-based crack detection. Presented at: The 30th EG-ICE: International Conference on Intelligent Computing in Engineering, London, UK, 4-7 July 2023.

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Item Type: Conference or Workshop Item (Paper)
Status: Unpublished
Schools: Engineering
Date of First Compliant Deposit: 19 May 2023
Date of Acceptance: 15 May 2023
Last Modified: 10 Jul 2023 01:30

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