Quantitative Electrostatic Force Microscopy-Phase Measurements

Lei, C. H., Das, Arindam, Elliott, Martin ORCID: https://orcid.org/0000-0002-9254-9898 and Macdonald, John Emyr ORCID: https://orcid.org/0000-0001-5504-1692 2004. Quantitative Electrostatic Force Microscopy-Phase Measurements. Nanotechnology 15 (5) , pp. 627-634. 10.1088/0957-4484/15/5/038

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Abstract

The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) technique used to measure electrostatic force gradient. EFM-phase has a higher resolution than scanning Kelvin probe microscopy (SKPM or SKM), but unlike SKPM it does not yield a direct measurement of local potential. Analytical calculations of tip–surface capacitances and their gradients are presented, and the origin of the measurement resolution in EFM-phase and SKPM is explained based on the calculation results. We show that EFM-phase data fit the analytical calculation well, and can be interpreted using a simple analytic model, which allows phase shift to be related to the local surface potential. The analytic formula is easy to calibrate and can be used to convert the EFM-phase data to potential data. This procedure is demonstrated on a poly-(3-hexylthiophene-2,5-diyl) (P3HT) thin film, contacted with Au electrodes, and the potential distributions of the Au/P3HT/Au structure under various biases are presented.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Uncontrolled Keywords:	Instrumentation and measurement; Surfaces, interfaces and thin films
ISSN:	0957-4484
Last Modified:	17 Oct 2022 08:58
URI:	https://orca.cardiff.ac.uk/id/eprint/1624

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