Lei, C. H., Das, Arindam, Elliott, Martin ![]() ![]() |
Abstract
The electrical properties of Au-on-poly(3-hexylthiophene) (P3HT) and P3HT on Au contacts have been compared, with high spatial resolution, using phase-mode electrostatic force microscopy (EFM-phase). The electrical potential profile, deduced from the phase measurements, demonstrates the existence of a high-resistance region in the P3HT close to the Au-on-P3HT contact, whereas the P3HT-on-Au contact exhibits good Ohmic behaviour. The results are consistent with recent I–V measurements, and can be explained in terms of defects induced during thermal evaporation of gold.
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Physics and Astronomy |
Subjects: | Q Science > QC Physics |
Uncontrolled Keywords: | Poly-(3-hexylthiophene); EFM-phase; Metal contact |
ISSN: | 0379-6779 |
Last Modified: | 17 Oct 2022 08:58 |
URI: | https://orca.cardiff.ac.uk/id/eprint/1625 |
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