Repeatability analysis of two methods for height measurements in the micrometer range

Ferri, C., Brousseau, Emmanuel Bruno Jean Paul ORCID: https://orcid.org/0000-0003-2728-3189, Dimov, Stefan Simeonov and Mattsson, L. 2006. Repeatability analysis of two methods for height measurements in the micrometer range. Presented at: 4M2006: Second International Conference on Multi-Material Micro Manufacture, Grenoble, France, 22-26 September 2006. Published in: Dimov, S., Menz, W. and Fillon, B. eds. 4M 2006 - Second International Conference on Multi-Material Micro Manufacture (Grenoble, France, 22-26 September 2006). Elsevier, pp. 165-168.

Full text not available from this repository.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering Research Institutes & Centres > Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Publisher:	Elsevier
ISBN:	0080452630
Last Modified:	18 Oct 2022 14:08
URI:	https://orca.cardiff.ac.uk/id/eprint/16582

Citation Data

Actions (repository staff only)

Edit Item