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Repeatability analysis of two methods for height measurements in the micrometer range

Ferri, C., Brousseau, Emmanuel Bruno Jean Paul ORCID: https://orcid.org/0000-0003-2728-3189, Dimov, Stefan Simeonov and Mattsson, L. 2006. Repeatability analysis of two methods for height measurements in the micrometer range. Presented at: 4M2006: Second International Conference on Multi-Material Micro Manufacture, Grenoble, France, 22-26 September 2006. Published in: Dimov, S., Menz, W. and Fillon, B. eds. 4M 2006 - Second International Conference on Multi-Material Micro Manufacture (Grenoble, France, 22-26 September 2006). Elsevier, pp. 165-168.

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Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Publisher: Elsevier
ISBN: 0080452630
Last Modified: 18 Oct 2022 14:08
URI: https://orca.cardiff.ac.uk/id/eprint/16582

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