Dielectric properties of diamond using an X-band microwave split dielectric resonator

Cuenca, Jerome A. ORCID: https://orcid.org/0000-0003-1370-1167, Mandal, Soumen ORCID: https://orcid.org/0000-0001-8912-1439, Stritt, Jaspa, Zheng, Xiang, Pomeroy, James, Kuball, Martin, Porch, Adrian ORCID: https://orcid.org/0000-0001-5293-8883 and Williams, Oliver A. ORCID: https://orcid.org/0000-0002-7210-3004 2024. Dielectric properties of diamond using an X-band microwave split dielectric resonator. Carbon 221 , 118860. 10.1016/j.carbon.2024.118860

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Abstract

This work presents an easy-to-use microwave split dielectric resonator (MSDR) for X-band dielectric measurements of free-standing unpolished poly-crystalline diamond (PCD). PCD grown with varying CH 4 /H 2 and O 2 / CH 4 /H 2 in the gas phase show stark differences in dielectric loss. Low microwave dielectric loss PCD is found for CH 4 /H 2 concentrations of less than 5% while PCD grown with O 2 show very high loss tangents. Vacuum annealing introduces non-diamond carbon (NDC) impurities which increases the loss, however, even after significant discolouration the loss is still lower than the O 2 grown PCD. The loss mechanism of O 2 grown PCD is likely due to a high concentration of grain boundaries and grain boundary hopping conduction mechanisms as opposed to high concentrations of NDC impurities.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Engineering Physics and Astronomy
Additional Information:	License information from Publisher: LICENSE 1: URL: http://creativecommons.org/licenses/by/4.0/, Start Date: 2024-01-25
Publisher:	Elsevier
ISSN:	0008-6223
Funders:	EPSRC
Date of First Compliant Deposit:	30 January 2024
Date of Acceptance:	24 January 2024
Last Modified:	16 Apr 2024 08:17
URI:	https://orca.cardiff.ac.uk/id/eprint/165910

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