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Dielectric properties of diamond using an X-band microwave split dielectric resonator

Cuenca, Jerome A. ORCID:, Mandal, Soumen ORCID:, Stritt, Jaspa, Zheng, Xiang, Pomeroy, James, Kuball, Martin, Porch, Adrian ORCID: and Williams, Oliver A. ORCID: 2024. Dielectric properties of diamond using an X-band microwave split dielectric resonator. Carbon 221 , 118860. 10.1016/j.carbon.2024.118860

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This work presents an easy-to-use microwave split dielectric resonator (MSDR) for X-band dielectric measurements of free-standing unpolished poly-crystalline diamond (PCD). PCD grown with varying CH 4 /H 2 and O 2 / CH 4 /H 2 in the gas phase show stark differences in dielectric loss. Low microwave dielectric loss PCD is found for CH 4 /H 2 concentrations of less than 5% while PCD grown with O 2 show very high loss tangents. Vacuum annealing introduces non-diamond carbon (NDC) impurities which increases the loss, however, even after significant discolouration the loss is still lower than the O 2 grown PCD. The loss mechanism of O 2 grown PCD is likely due to a high concentration of grain boundaries and grain boundary hopping conduction mechanisms as opposed to high concentrations of NDC impurities.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Engineering
Physics and Astronomy
Additional Information: License information from Publisher: LICENSE 1: URL:, Start Date: 2024-01-25
Publisher: Elsevier
ISSN: 0008-6223
Funders: EPSRC
Date of First Compliant Deposit: 30 January 2024
Date of Acceptance: 24 January 2024
Last Modified: 16 Apr 2024 08:17

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