Baker, J., Allford, C. P. ![]() ![]() ![]() ![]() |
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Official URL: https://doi.org/10.1109/islc57752.2024.10717337
Abstract
VCSEL thermal resistances are determined from power-current-voltage-wavelength measurements performed on nominally identical epitaxial structures grown on Ge and GaAs substrates. It is shown, for the first time, that an improved thermal performance can be achieved through growth on Ge.
Item Type: | Conference or Workshop Item (Paper) |
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Date Type: | Published Online |
Status: | Published |
Schools: | Schools > Physics and Astronomy |
Publisher: | IEEE |
ISBN: | 979-8-3503-7299-1 |
Date of First Compliant Deposit: | 27 January 2025 |
Date of Acceptance: | 1 October 2024 |
Last Modified: | 18 Feb 2025 10:00 |
URI: | https://orca.cardiff.ac.uk/id/eprint/173645 |
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