(S)TEM Characterisation of InAs/MgO/Co Multilayers

Eustace, D. A., McComb, D. W., Buckle, L., Buckle, Philip Derek ORCID: https://orcid.org/0000-0001-9508-7783, Ashley, T., Singh, L. J., Barber, Z. H., Gilbertson, A. M., Branford, W. R., Clowes, S. K. and Cohen, L. F. 2008. (S)TEM Characterisation of InAs/MgO/Co Multilayers. Presented at: Microscopy of semiconducting materials, 15th Conference, Cambridge, UK, 2-5 April 2007. Proceedings of the 15th Conference on Microscopy of Semiconducting Materials, Cambridge, UK, 2-5 April 2007. Springer Proceedings in Physics (120) Dordrecht: Springer Verlag, pp. 153-156. 10.1007/978-1-4020-8615-1_32

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Abstract

The structural integrity, composition and interface quality of tunnel barriers in hybrid ferromagnet-semiconductor structures will have a significant effect on the properties of spintronic devices. We present the results of a study of an amorphous MgO tunnel barrier in a Co/MgO/InAs multilayer structure. Optimum growth parameters for MgO and surface treatment of InAs have been identified by a systematic electron microscopy investigation. Electron energy loss spectroscopy has been used to obtain information on composition and interface quality in the multilayer structures.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	Springer Verlag
ISBN:	9781402086151
ISSN:	0930-8989
Last Modified:	19 May 2023 01:38
URI:	https://orca.cardiff.ac.uk/id/eprint/18031

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