XPS insight note: Carbon Sp2–Sp3 ratios derived from the carbon Auger signal and its accuracy

Graf, A., Isaacs, M. A. and Morgan, D. J. ORCID: https://orcid.org/0000-0002-6571-5731 2025. XPS insight note: Carbon Sp2–Sp3 ratios derived from the carbon Auger signal and its accuracy. Surface and Interface Analysis 10.1002/sia.70037

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Abstract

Understanding the surface chemistry of carbon materials is typically explored using x-ray photoelectron spectroscopy (XPS). Researchers typically focus on the C(1s) core-level to deduce chemistry, often overlooking complementary spectral information. This insight note summarizes the use of the x-ray excited Auger peak for carbon, deriving the D-parameter to aid in the measurement of sp2—sp3 ratios.

Item Type:	Article
Date Type:	Publication
Status:	In Press
Schools:	Schools > Chemistry
Publisher:	Wiley
ISSN:	0142-2421
Date of First Compliant Deposit:	15 December 2025
Date of Acceptance:	28 December 2025
Last Modified:	15 Dec 2025 13:45
URI:	https://orca.cardiff.ac.uk/id/eprint/183237

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