Yan, Zhao, Grieb, Tim, Zhang, Weiwei, Ebert, Martin, Krause, Florian F., Reed, Graham T, Thomson, David, Rosenauer, Andreas and Li, Qiang ORCID: https://orcid.org/0000-0002-5257-7704
2026.
Integration of InP membranes with embedded InGaAs quantum wells on silicon-on-insulator by tunnel epitaxy.
Nanotechnology
10.1088/1361-6528/ae4985
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Abstract
Integration of III–V membranes on silicon-on-insulator (SOI) substrates offers a promising route to provide on-chip gain for dense silicon (Si) photonics. Here, we present a materials study of InP membranes with embedded InGaAs multi-quantum wells (MQWs) directly grown above the Si waveguide layer via a tunnel epitaxy process. Cross-sectional scanning transmission electron microscopy (STEM), combining differential phase contrast (DPC) imaging, energy-dispersive X-ray spectroscopy (EDX), and atomic-column-based strain analysis, confirms high-quality laterally grown InP membranes with defects confined to the V-groove region and elucidates facet-dependent MQW formation on (111)A, (110), and (111)B facets. Both EDX and strain analysis consistently reveal high-In, highly compressively strained (110) QWs (>80% In), and no misfit dislocations are observed at InP/InGaAs interfaces. In addition, under identical precursor ratios, ultra-thin QWs incorporate a higher indium composition than a thick bulk InGaAs region. These results provide practical guidance for designing efficient active regions in future electrically injected, Si-waveguide-coupled InP membrane lasers on SOI.
| Item Type: | Article |
|---|---|
| Date Type: | Published Online |
| Status: | In Press |
| Schools: | Schools > Physics and Astronomy |
| Publisher: | IOP Publishing |
| ISSN: | 0957-4484 |
| Date of First Compliant Deposit: | 25 February 2026 |
| Date of Acceptance: | 24 February 2026 |
| Last Modified: | 25 Feb 2026 11:46 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/185268 |
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