X-ray photoelectron spectroscopy study of the role of nitrogen in FeSiAl(N) reactive sputtered films

Snyder, John Evan and Andregg, J W 2002. X-ray photoelectron spectroscopy study of the role of nitrogen in FeSiAl(N) reactive sputtered films. Journal of Applied Physics 91 (10) , pp. 8459-8461. 10.1063/1.1453949

Preview

PDF Download (46kB) | Preview

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Engineering
Additional Information:	Publisher's copyright requirements "Copyright (2004) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Tian, Y and Li, G and Shinar, J and Wang, N. L. and Cook, B A and Anderegg, J. W. and Constant, A. P. and Russell, A M and Snyder, John Evan (2004) Electrical transport in amorphous semiconducting AlMgB14 films. Applied Physics Letters , 85 (7). pp. 1181-1183. ISSN 10773118 (10.1063/1.1781738)and may be found at http://apl.aip.org/resource/1/applab/v85/i7/p1181_s1."
ISSN:	10897550
Last Modified:	23 May 2023 06:13
URI:	https://orca.cardiff.ac.uk/id/eprint/1934

Citation Data

Cited 3 times in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item