Williams, David J., Leckey, Jonathan and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2003. Envelope domain analysis of measured time domain voltage and current waveforms provide for improved understanding of factors effecting linearity. Presented at: IEEE MTT-S International Microwave Symposium Digest 2003, Vol 2, 2003. pp. 1411-1412. 10.1109/MWSYM.2003.1212636 |
Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumb...
Abstract
A detailed understanding of the factors affecting amplifier linearity can be obtained by performing envelope domain analysis on measured time domain voltage and current waveforms. Analysis of the input and output time varying envelopes provides for a direct observation of amplifier linearization through IF (baseband) source pull.
Item Type: | Conference or Workshop Item (Paper) |
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Date Type: | Publication |
Status: | Published |
Schools: | Engineering |
Additional Information: | ISBN: 0780376951 |
ISSN: | 0149-645X |
Last Modified: | 17 Oct 2022 09:04 |
URI: | https://orca.cardiff.ac.uk/id/eprint/1951 |
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