Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis

Canetta, Elisabetta and Adya, Ashok 2011. Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis. Forensic Science International 210 (1-3) , pp. 16-25. 10.1016/j.forsciint.2011.01.029

Full text not available from this repository.

Abstract

Pressure sensitive adhesive (PSA), such as those used in packaging and adhesive tapes, are very often encountered in forensic investigations. In criminal activities, packaging tapes may be used for sealing packets containing drugs, explosive devices, or questioned documents, while adhesive and electrical tapes are used occasionally in kidnapping cases. In this work, the potential of using atomic force microscopy (AFM) in both imaging and force mapping (FM) modes to derive additional analytical information from PSAs is demonstrated. AFM has been used to illustrate differences in the ultrastructural and nanomechanical properties of three visually distinguishable commercial PSAs to first test the feasibility of using this technique. Subsequently, AFM was used to detect nanoscopic differences between three visually indistinguishable PSAs.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Biosciences
Subjects:	Q Science > Q Science (General) T Technology > TK Electrical engineering. Electronics Nuclear engineering
Uncontrolled Keywords:	Atomic force microscopy (AFM); force mapping; nanotechnology; Pressure Sensitive Adhesive (PSA); mechanical properties; items of recovery
Publisher:	Elsevier
ISSN:	0379-0738
Last Modified:	25 Jun 2017 02:48
URI:	https://orca.cardiff.ac.uk/id/eprint/19523

Citation Data

Cited 17 times in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item