Characterisation of high power RF transistors: Waveform measurement and engineering

Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 and Tasker, Paul ORCID: https://orcid.org/0000-0002-6760-7830 2007. Characterisation of high power RF transistors: Waveform measurement and engineering. Presented at: Proceedings Workshop on Advances in Active Device Characterisation and Modelling for RF and Microwave, IEEE MTT-S International Microwave Symposium,

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Item Type:	Conference or Workshop Item (Paper)
Schools:	Schools > Engineering
Last Modified:	19 Oct 2022 09:18
URI:	https://orca.cardiff.ac.uk/id/eprint/20713

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