Investigation of a new process chain based on atomic force microscopy scratching

Brousseau, Emmanuel Bruno Jean Paul ORCID: https://orcid.org/0000-0003-2728-3189, Krohs, F., Dimov, Stefan Simeonov, Griffiths, C. A., Scholz, S. G., Rees, A. and Fatikow, S. 2009. Investigation of a new process chain based on atomic force microscopy scratching. Presented at: Fifth International Conference on Multi-Material Micro Manufacture, 4M2009, Karlsruhe, Germany, pp. 267-270.

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Item Type:	Conference or Workshop Item (Paper)
Schools:	Schools > Engineering Research Institutes & Centres > Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Last Modified:	19 Oct 2022 09:19
URI:	https://orca.cardiff.ac.uk/id/eprint/20777

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