Vella, P. C., Brousseau, Emmanuel Bruno Jean Paul  ORCID: https://orcid.org/0000-0003-2728-3189, Minev, R. and Dimov, Stefan Simeonov
2010.
A methodology for technology maturity assessment of micro and nano manufacturing processes and process chains.
Presented at: 5th International Conference on Micro Manufacturing (ICOMM/4M2010),
Madison, USA,
pp. 327-334.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Schools: | Schools > Engineering Research Institutes & Centres > Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC) |
| Last Modified: | 19 Oct 2022 09:33 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/21457 |
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