A methodology for technology maturity assessment of micro and nano manufacturing processes and process chains

Vella, P. C., Brousseau, Emmanuel Bruno Jean Paul ORCID: https://orcid.org/0000-0003-2728-3189, Minev, R. and Dimov, Stefan Simeonov 2010. A methodology for technology maturity assessment of micro and nano manufacturing processes and process chains. Presented at: 5th International Conference on Micro Manufacturing (ICOMM/4M2010), Madison, USA, pp. 327-334.

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Item Type:	Conference or Workshop Item (Paper)
Schools:	Engineering Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Last Modified:	19 Oct 2022 09:33
URI:	https://orca.cardiff.ac.uk/id/eprint/21457

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