Utilization of RF I-V waveform load-pull information to identify the role FET knee profile has on locating the efficiency maxima

Canning, Timothy A. J., Almuhaisen, Abdullah, Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349, Cripps, Stephen Charles ORCID: https://orcid.org/0000-0002-2258-951X and Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 2011. Utilization of RF I-V waveform load-pull information to identify the role FET knee profile has on locating the efficiency maxima. Presented at: 2011 78th ARFTG Microwave Measurement Symposium (ARFTG), Tempe, AZ, USA, 1-2 December 2011. Proceedings of the 2011 78th ARFTG Microwave Measurement Symposium (ARFTG) - High Power RF Measurement Techniques. Los Alamitos, CA: IEEE, 10.1109/ARFTG78.2011.6183864

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Abstract

Typically performance maxima in terms of output power, efficiency, etc. are determined from analyzing, effectively “data mining”, load-pull measurements. This approach while identifying relevant design information provides no insight into the origin or location of the relevant maxima. However, if during load-pull measurements the RF I-V waveforms are also measured this insight is available. Measured RF I-V waveform load-pull information from a 10×75μm Gallium Arsenide transistor operating in class-B at 8GHz is used to correctly identify the effect of the knee region of the transistor I-V characteristic on power and efficiency. As a consequence the location of the drain efficiency contours on the Smith Chart are explained in terms of Vmin and current waveform compression.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Uncontrolled Keywords:	Amplifier Knee, class-B, high efficiency, power amplifier, waveform engineering
Publisher:	IEEE
ISBN:	9781467302814
Last Modified:	21 Oct 2022 09:23
URI:	https://orca.cardiff.ac.uk/id/eprint/36182

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