Canning, Timothy A. J., Almuhaisen, Abdullah, Lees, Jonathan ![]() ![]() ![]() ![]() |
Abstract
Typically performance maxima in terms of output power, efficiency, etc. are determined from analyzing, effectively “data mining”, load-pull measurements. This approach while identifying relevant design information provides no insight into the origin or location of the relevant maxima. However, if during load-pull measurements the RF I-V waveforms are also measured this insight is available. Measured RF I-V waveform load-pull information from a 10×75μm Gallium Arsenide transistor operating in class-B at 8GHz is used to correctly identify the effect of the knee region of the transistor I-V characteristic on power and efficiency. As a consequence the location of the drain efficiency contours on the Smith Chart are explained in terms of Vmin and current waveform compression.
Item Type: | Conference or Workshop Item (Paper) |
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Date Type: | Publication |
Status: | Published |
Schools: | Engineering |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Uncontrolled Keywords: | Amplifier Knee, class-B, high efficiency, power amplifier, waveform engineering |
Publisher: | IEEE |
ISBN: | 9781467302814 |
Last Modified: | 21 Oct 2022 09:23 |
URI: | https://orca.cardiff.ac.uk/id/eprint/36182 |
Citation Data
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