Waveform Engineering beyond the Safe Operating Region: Fully Active Harmonic Load Pull Measurements under Pulsed Conditions

Casbon, Michael A. ORCID: https://orcid.org/0000-0002-8637-9888, Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830 and Benedikt, Johannes ORCID: https://orcid.org/0000-0002-9583-2349 2011. Waveform Engineering beyond the Safe Operating Region: Fully Active Harmonic Load Pull Measurements under Pulsed Conditions. Presented at: 2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), Waikoloa, HI, USA, 16-19 October 2011. Proceedings of the 2011 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) - INTEGRATED CIRCUITS IN GaAs, InP, SiGe, GaN and Other Compound Semiconductors. Los Alamitos, CA: IEEE, 10.1109/CSICS.2011.6062435

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Abstract

It is often desirable to measure device characteristics under non-continuous operation, perhaps to better simulate actual operating conditions, to reduce the thermal loading or to investigate RF operation going beyond the CW safe operating region. In this paper a measurement solution is presented that allows for the concept of experimental RF waveform engineering to be undertaken under such conditions. The system is demonstrated by using it to investigate the feasibility of operating GaAs based HEMT technology under pulsed conditions in high efficiency modes that required high RF voltage swings that extend beyond their rated CW safe operating region.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher:	IEEE
ISBN:	9781612847115
Last Modified:	21 Oct 2022 09:25
URI:	https://orca.cardiff.ac.uk/id/eprint/36269

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