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Size-dependent bending of thin metallic films

Zhu, W. and Karihaloo, Bhushan Lal ORCID: https://orcid.org/0000-0003-0657-2678 2008. Size-dependent bending of thin metallic films. Presented at: IUTAM Symposium on Scaling in Solid Mechanics, Cardiff, UK, 25-29 June 2007. Published in: Borodich, Feodor M. ed. IUTAM Symposium on Scaling in Solid Mechanics: Proceedings of the IUTAM Symposium. IUTAM Bookseries Springer, pp. 299-309. 10.1007/978-1-4020-9033-2_28

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Abstract

Size-dependent pure bending of thin metallic films has been analytically studied taking into account the associated strengthening mechanisms at different thickness scales. The classical plasticity theory is applicable to films thicker than 100 microns. Consequently, their bending capacity is governed by the competition between the material hardening and the thickness reduction. For films with a thickness ranging from fractions of a micron to a few microns, in addition to the above mechanisms, the strain gradient effect plays an important role and introduces an internal length scale. When the film thickness reduces to the nano-scale, the strain gradient effect is gradually replaced by the dominant surface stress/energy effect.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Schools > Engineering
Subjects: T Technology > TJ Mechanical engineering and machinery
Publisher: Springer
ISBN: 9781402090325
Last Modified: 15 Oct 2025 10:02
URI: https://orca.cardiff.ac.uk/id/eprint/37428

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