Reconstructing residual stress depth profiles using magnetic Barkhausen noise method (FQ-12).

Mierczak, Lukasz, Melikhov, Yevgen ORCID: https://orcid.org/0000-0002-9787-5238 and Jiles, David 2011. Reconstructing residual stress depth profiles using magnetic Barkhausen noise method (FQ-12). Presented at: 55th Conference on Magnetism and Magnetic Materials (MMM), Atlanta, USA, 14 - 18 November 2010. Proceedings of the 55th Annual Conference on Magnetism and Magnetic Materials Atlanta, Georgia, 14 - 18 November 2010 [55th MMM Annual Conference]. Melville, NY: American Institute of Physics, p. 209.

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Item Type:	Conference or Workshop Item (Poster)
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Additional Information:	Session FQ: Magnetic sensors 1 (Poster Session)
Publisher:	American Institute of Physics
ISBN:	9780735409248
Related URLs:	Organisation
Last Modified:	06 Jul 2023 02:19
URI:	https://orca.cardiff.ac.uk/id/eprint/40003

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