Mierczak, Lukasz, Melikhov, Yevgen  ORCID: https://orcid.org/0000-0002-9787-5238 and Jiles, David
2011.
Reconstructing residual stress depth profiles using magnetic Barkhausen noise method (FQ-12).
Presented at: 55th Conference on Magnetism and Magnetic Materials (MMM),
Atlanta, USA,
14 - 18 November 2010.
Proceedings of the 55th Annual Conference on Magnetism and Magnetic Materials Atlanta, Georgia, 14 - 18 November 2010 [55th MMM Annual Conference].
Melville, NY:
American Institute of Physics,
p. 209.
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Full text not available from this repository.
| Item Type: |
Conference or Workshop Item
(Poster)
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| Date Type: |
Publication |
| Status: |
Published |
| Schools: |
Schools > Engineering |
| Subjects: |
T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Additional Information: |
Session FQ: Magnetic sensors 1 (Poster Session) |
| Publisher: |
American Institute of Physics |
| ISBN: |
9780735409248 |
| Related URLs: |
|
| Last Modified: |
06 Jul 2023 02:19 |
| URI: |
https://orca.cardiff.ac.uk/id/eprint/40003 |
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