Determining depth dependence of mechanical properties from micromagnetic emissions

Mierczak, Lukasz, Jiles, David, Melikhov, Yevgen ORCID: https://orcid.org/0000-0002-9787-5238 and Kypris, D. 2011. Determining depth dependence of mechanical properties from micromagnetic emissions. Presented at: 56th Annual Conference on Magnetism and Magnetic Materials, Scottsdale, AZ, USA, 30 October - 3 November 2011.

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Item Type:	Conference or Workshop Item (Paper)
Date Type:	Completion
Status:	Unpublished
Schools:	Schools > Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Last Modified:	06 Jul 2023 02:20
URI:	https://orca.cardiff.ac.uk/id/eprint/40886

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