X-ray diffraction study of the structure of thin polyfluorene films

Kawana, S., Durrell, M., Lu, J., Macdonald, John Emyr ORCID: https://orcid.org/0000-0001-5504-1692, Grell, M., Bradley, D. D. C., Jukes, P. C., Jones, R. A. L. and Bennett, S. L. 2002. X-ray diffraction study of the structure of thin polyfluorene films. Polymer 43 (6) , pp. 1907-1913. 10.1016/S0032-3861(01)00753-4

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Abstract

The molecular arrangement in thin films of poly(9,9-dioctylfluorene) and poly(9,9-dihexylfluorene) deposited on silicon substrates has been investigated with grazing incidence X-ray diffraction. In particular, the effect of the interface on the molecular orientation is highlighted. Both materials display a periodicity normal to the surface arising from stacked sheets of fluorene chains in both the crystalline and liquid crystalline phases. For the crystalline phase, a periodicity in the plane of the surface of 4.15 Å is observed corresponding to half the fluorene ring repeat distance along the backbone, consistent with interdigitating side-chains. For crystalline films deposited onto rubbed polyimide films, strong orientation effects are observed. In the liquid-crystalline phase, this strong in-plane ordering of backbones is lost. Poly(9,9-dihexylfluorene) exhibits an additional degree of ordering in the plane of the interface, which is likely to arise from hexagonal ordering of the backbone chains.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Schools > Physics and Astronomy
Subjects:	Q Science > QC Physics
Uncontrolled Keywords:	Polyfluorene; Grazing incidence X-ray diffraction;Thin films
Publisher:	Elsevier
ISSN:	0032-3861
Last Modified:	24 Oct 2022 10:46
URI:	https://orca.cardiff.ac.uk/id/eprint/45812

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