Combined (1×2)?(1×1) transition and atomic roughening of Ge(001) studied with surface x-ray diffraction

Johnson, A., Norris, C., Frenken, J., Derbyshire, H., MacDonald, John Emyr ORCID: https://orcid.org/0000-0001-5504-1692, Van Silfhout, R. and Van Der Veen, J. 1991. Combined (1×2)?(1×1) transition and atomic roughening of Ge(001) studied with surface x-ray diffraction. Physical Review B 44 (3) , pp. 1134-1138. 10.1103/PhysRevB.44.1134

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Abstract

Surface x-ray-diffraction measurements are presented that show a reversible (1×2)→(1×1) phase transition of the Ge(001) surface. The variation of the (1×2) superlattice reflection intensity with temperature gives a transition temperature of Tc=955±7 K. The data are interpreted as being due to the creation of adatoms and vacancies on the surface with consequent break up of surface dimers. X-ray reflectivity indicates a corresponding loss of height-height correlation across the surface. A simple three-level model is used to describe the reflectivity, and the results are compared with a simple Monte Carlo simulation of the transition

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	American Physical Society
ISSN:	0163-1829
Last Modified:	24 Oct 2022 10:51
URI:	https://orca.cardiff.ac.uk/id/eprint/46140

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