Grazing-incidence x-ray-diffraction studies of strain relaxation in monolayer-thick films

MacDonald, John Emyr ORCID: https://orcid.org/0000-0001-5504-1692, Williams, A. A., Thornton, J. M. C., Vansilfhout, R. G., Vanderveen, J. F., Finney, M. S. and Norris, C. 1991. Grazing-incidence x-ray-diffraction studies of strain relaxation in monolayer-thick films. Presented at: 7th Conference on Microscopy of Semiconducting Materials, Oxford, UK, 25-28 March 1991. Published in: Cullis, A. G. and Long, N. J. eds. Microscopy of semiconducting materials 1991: Conference Papers. Institute of Physics Conference Series , vol.117 London: Institute of Physics, pp. 645-650.

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Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	Institute of Physics
ISBN:	0854984062
Last Modified:	24 Oct 2022 11:20
URI:	https://orca.cardiff.ac.uk/id/eprint/47752

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