Caustic imaging of gallium droplets using mirror electron microscopy

Kennedy, S. M., Zheng, C. X., Tang, Wen-Xin, Paganin, D. M. and Jesson, David E. ORCID: https://orcid.org/0000-0003-0897-1445 2011. Caustic imaging of gallium droplets using mirror electron microscopy. Ultramicroscopy 111 (5) , pp. 356-363. 10.1016/j.ultramic.2011.01.019

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Abstract

We discuss a new interpretation of mirror electron microscopy (MEM) images, whereby electric field distortions caused by surface topography and/or potential variations are sufficiently large to create caustics in the image contrast. Using a ray-based trajectory method, we consider how a family of rays overlaps to create caustics in the vicinity of the imaging plane of the magnetic objective lens. Such image caustics contain useful information on the surface topography and/or potential, and can be directly related to surface features. Specifically we show how a through-focus series of MEM images can be used to extract the contact angle of a Ga droplet on a GaAs (001) surface.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Uncontrolled Keywords:	Mirror electron microscopy (MEM); Caustic imaging; Ga droplets; GaAs; Contact angle
Publisher:	Elsevier
ISSN:	0304-3991
Last Modified:	24 Oct 2022 11:37
URI:	https://orca.cardiff.ac.uk/id/eprint/48800

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