Laplacian image contrast in mirror electron microscopy

Kennedy, S. M., Zheng, C. X., Tang, Wen-Xin, Paganin, D. M. and Jesson, David E. ORCID: https://orcid.org/0000-0003-0897-1445 2010. Laplacian image contrast in mirror electron microscopy. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 466 (2124) , pp. 2857-2874. 10.1098/rspa.2010.0093

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Abstract

We discuss an intuitive approach to interpreting mirror electron microscopy (MEM) images, whereby image contrast is primarily caused by the Laplacian of small height or potential variations across a sample surface. This variation is blurred slightly to account for the interaction of the electrons with the electrical potential away from the surface. The method is derived from the established geometrical theory of MEM contrast, and whilst it loses quantitative accuracy outside its domain of validity, it retains a simplicity that enables rapid interpretation of MEM images. A strong parallel exists between this method and out of focus contrast in transmission electron microscopy (TEM), which allows a number of extensions to be made, such as including the effects of spherical and chromatic aberration.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Uncontrolled Keywords:	mirror electron microscopy; Laplacian image contrast; phase contrast; Ga droplets; GaAs
Additional Information:	Correction published in vol. 467, p. 3332, DOI 10.1098/rspa.2011.0204
Publisher:	Royal Society
ISSN:	1364-5021
Last Modified:	24 Oct 2022 11:38
URI:	https://orca.cardiff.ac.uk/id/eprint/48801

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