Spectral speckle analysis of resonant secondary emission from solids

Kocherscheidt, G., Langbein, Wolfgang Werner ORCID: https://orcid.org/0000-0001-9786-1023, Mannarini, G. and Zimmermann, R. 2002. Spectral speckle analysis of resonant secondary emission from solids. Physical Review B 66 (16) , 161314(R). 10.1103/PhysRevB.66.161314

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Abstract

A linear optical method to measure coherence and dephasing of excitations in solids is presented. The spectrally resolved degree of coherence of resonantly scattered light is deduced from the intensity fluctuations over its emission directions (speckles). The spectral intensity correlation gives a direct measure of the dephasing rate within the inhomogeneously broadened ensemble. For localized excitons in semiconductor quantum wells, the combination of static disorder, phonon scattering, and radiative decay leads to a spectral dependence of the emission coherence and the dephasing rate, which is well described by model calculations.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	American Physical Society
ISSN:	0163-1829
Last Modified:	24 Oct 2022 11:39
URI:	https://orca.cardiff.ac.uk/id/eprint/48912

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