Ultrafast dynamics of confined and localized excitons in low-dimensional semiconductors

Hvam, Jorn M., Langbein, Wolfgang Werner ORCID: https://orcid.org/0000-0001-9786-1023 and Borri, Paola ORCID: https://orcid.org/0000-0002-7873-3314 1999. Ultrafast dynamics of confined and localized excitons in low-dimensional semiconductors. Presented at: Conference on Ultrafast Phenomena in Semiconductors III, San Jose, CA, 27-29 January 1999. Published in: Tsen, Kong-Thon F. ed. Ultrafast Phenomena in Semiconductors III: 27-29 January, 1999, San Jose, California. SPIE Proceedings Series (3624) Bellingham, WA: The International Society for Optical Engineering (SPIE), pp. 40-48. 10.1117/12.349310

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Abstract

Coherent optical spectroscopy in the form of nonlinear transient four-wave mixing (TFWM) and linear resonant Rayleigh scattering (RRS) has been applied to investigate the exciton dynamics in low-dimensional semiconductor heterostructures. The dephasing times of excitons are determined from the decay of the spectrally resolved non-linear signal as a function of the delay between the incident pulses in a two-beam TFWM experiment, and from the real time analysis of single speckles in RRS experiments (pure dephasing). From the density- and temperature-dependence of the dephasing times the exciton-exciton and the exciton-phonon interactions are determined. The degree of coherence of the secondary emission is determined from the speckle analysis.

Item Type:	Conference or Workshop Item (Paper)
Date Type:	Publication
Status:	Published
Schools:	Schools > Biosciences Schools > Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	The International Society for Optical Engineering (SPIE)
ISBN:	0819430943
ISSN:	0277-786X
Last Modified:	13 Dec 2022 09:40
URI:	https://orca.cardiff.ac.uk/id/eprint/60266

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