Koh, M., Bell, James J. ![]() ![]() ![]() |
Abstract
This paper combines the advantages of accurate measurement based non-linear behavioral look-up table transistor models with passive embedding networks to develop a scalable large signal model. This approach provides for a more robust utilization of measurement based data models in X-band MMIC design by providing accurate performance predictions as a function of gate periphery and at power levels beyond the limitations of high frequency measurement systems. An example is provided where a 1 W Gallium Nitride reference device, characterized in Class B at 9 GHz, delivering over 70% efficiency, is used to accurately predict the behavior of devices with up to 5 times larger gate periphery.
Item Type: | Conference or Workshop Item (Paper) |
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Date Type: | Publication |
Status: | Published |
Schools: | Engineering |
Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
Publisher: | IEEE |
ISBN: | 9781467361774 |
ISSN: | 0149-645X |
Last Modified: | 27 Oct 2022 09:06 |
URI: | https://orca.cardiff.ac.uk/id/eprint/64359 |
Citation Data
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