Speckle analysis of resonant secondary emission

Langbein, Wolfgang Werner ORCID: https://orcid.org/0000-0001-9786-1023 2002. Speckle analysis of resonant secondary emission. physica status solidi (b) 234 (1) , pp. 84-95. 10.1002/1521-3951(200211)234:1<84::AID-PSSB84>3.0.CO;2-Y

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Abstract

The technique of the speckle analysis of resonant secondary emission is reviewed. It is a novel, linear optical technique to measure the microscopic intensity and polarization dynamics in inhomogeneously broadened ensembles, that represents an alternative for established non-linear optical techniques such as photon-echo or spectral hole burning. Both time-resolved and spectrally resolved variants of the speckle analysis are discussed. Experimental results obtained on semiconductor quantum wells using both techniques are presented.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Schools > Physics and Astronomy
Subjects:	Q Science > QC Physics
Publisher:	Wiley
ISSN:	1521-3951
Last Modified:	28 Oct 2022 08:36
URI:	https://orca.cardiff.ac.uk/id/eprint/71433

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