Principle of determining thermoelectric properties based on I–V curves

Gao, Min ORCID: https://orcid.org/0000-0001-9591-5825 2014. Principle of determining thermoelectric properties based on I–V curves. Measurement Science and Technology 25 (8) , 085009. 10.1088/0957-0233/25/8/085009

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Abstract

This paper describes a measurement principle of determining thermoelectric properties based on obtaining current–voltage (I–V) curves under two different operating conditions: (1) constant temperature difference and (2) constant thermal input flux. In addition to thermoelectric figure-of-merit, other thermoelectric properties including the Seebeck coefficient, electrical resistivity and thermal conductivity can also be derived from I–V measurements. An advantage of this technique is its ability to detect the influence of the Thomson effect and to characterize the segmented thermoelectric structures due to the fact that a measurement can be taken under a large temperature difference in a closed circuit condition. Furthermore, it has a potential to achieve high measurement accuracy because the error due to the contact resistance is eliminated.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher:	IOP Publishing
ISSN:	0957-0233
Last Modified:	28 Oct 2022 09:39
URI:	https://orca.cardiff.ac.uk/id/eprint/75193

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