Kettle, J., Hoyle, R. T. and Dimov, Stefan Simeonov 2009. Fabrication of Step-and-Flash Imprint Lithography (S-FIL) templates using XeF2 enhanced focused Ion Beam Etching. Journal of Applied Physics A: Materials Science and Processing 96 (4) , pp. 819-825. 10.1007/s00339-009-5319-7 |
Item Type: | Article |
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Schools: | Engineering |
ISSN: | 0947-8396 |
Last Modified: | 19 Mar 2016 22:12 |
URI: | https://orca.cardiff.ac.uk/id/eprint/7884 |
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