| Lo, C. C. H., Snyder, John Evan, Leib, J., Chen, R., Sutton, B., Kramer, M. J., Jiles, David and Kief, M. T. 2001. Magnetic force microscopy study of magnetization reversal in sputtered FeSiAl(N) films. Journal of Applied Physics 89 (5) , pp. 2868-2872. 10.1063/1.1344579 |
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| Item Type: | Article |
|---|---|
| Schools: | Schools > Engineering |
| ISSN: | 0021-8979 |
| Last Modified: | 05 May 2023 18:52 |
| URI: | https://orca.cardiff.ac.uk/id/eprint/8298 |
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