Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence

Brazzini, Tommaso, Casbon, Michael A. ORCID: https://orcid.org/0000-0002-8637-9888, Sun, Huarui, Uren, Michael J., Lees, Jonathan ORCID: https://orcid.org/0000-0002-6217-7552, Tasker, Paul J. ORCID: https://orcid.org/0000-0002-6760-7830, Jung, Helmut, Blanck, Herve and Kuball, Martin 2015. Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence. Microelectronics Reliability 55 (12) , pp. 2493-2498. 10.1016/j.microrel.2015.09.023

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Item Type:	Article
Date Type:	Published Online
Status:	Published
Schools:	Engineering
Subjects:	R Medicine > R Medicine (General)
Publisher:	Elsevier
ISSN:	0026-2714
Date of First Compliant Deposit:	21 July 2016
Date of Acceptance:	23 September 2015
Last Modified:	05 May 2023 23:53
URI:	https://orca.cardiff.ac.uk/id/eprint/93008

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